Abstract
The ATLAS level-1 muon endcap trigger system is divided into three parts; one off-detector part and two on-detector parts. Application specific ICs (ASICs) and anti-fuse Field Programmable Gate Array (FPGAs) are actively used in the on-detector parts. A Low-Voltage Data Signaling (LVDS) serial link is used for the data transfer between the two on-detector parts (15 m apart) and G-Link (Hewlett-Packard 1.4 Gbaud high speed data link) with optical transmission (90 m) is used from one of the on-detector parts to the off-detector part. These components will be exposed to a radiation of approximately 200 Gy (including safety factors) for ten years corresponding to a total ionizing dose (TID) and a hadron fluence of 2/spl times/10/sup 10/ hadrons/cm/sup 2/. We have investigated systematically the radiation susceptibility to both the total ionizing dose and the single event effects for ASIC, FPGA, and Commercial Off The Shelf (COTS) serializer and deserializer chipsets for two types of LVDS serial link and one G-Link type. In this documentation we report the result of the irradiation tests for these devices and discuss their validity in the ATLAS system.
Highlights
THREE types of Application specific IC (ASIC) are extensively used in the core part of the ATLAS end-cap muon level-1 system [1]
The radiation tolerance of ROHM 0.35μm CMOS ASIC chips as well as two Actel Anti-fuse FPGA chips have been examined with the total ionizing dose (TID) and single event effect (SEE) measurements
From the estimations based on the measurements resulted in both tests, we found both ASIC and FPGA chips can be used in the ATLAS level-1 muon endcap trigger system without introducing serious degradation for the performance
Summary
Abstract-- The ATLAS end-cap muon level-1 trigger system is divided into three parts; one off-detector part and two ondetector parts. Data transfer with Low-Voltage Data Signaling serial link (LVDS link) is used between two ondetector parts (15m apart) and G-Link (Hewlett-Packard 1.4Gbaud high speed data link) with optical transmission(90m) is used from one of the on-detector parts to the off-detector part. These components will suffer for ten years the radiation of approximately 200Gy of total ionizing dose (TID) and a hadron fluence of 2x1010 hadrons/cm. In this presentation we report the result of irradiation tests for these devices and discuss validity of them to use in the system
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