Abstract
Radiation effects in microelectronic components have been studied for several decades for military and space applications. Understanding radiation effects in electronics is a complex and continually evolving challenge. In this paper, we present an extensive literature review pertaining to the state-of-the-art issues in radiation effects and radiation-hardened circuit design. Various research papers, books and application notes were referred, which take care of various aspects of understanding of radiation effects. In particular, this review gives a bibliographical survey of the current research efforts in the area of radiation effects in metal-oxide-semiconductor based devices and circuits. The paper also presents some of the challenges anticipated in the years to come and enlists further scope for research. A full description of the various methods is beyond the scope of this article; instead, the focus is on providing primary developments that have taken place in the area of radiation effects.
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