Abstract
A quartz crystal microbalance which detects a mass change of 0.35×10-2 µg/cm2 and has a drift less than 1 Hz over a day has been constructed for measurement of weight gain due to chemical reactions. The frequencies of two oscillators, standard and specimen oscillators, are mixed and the difference frequency is measured by a counting-rate meter. To reduce the difference frequency at any stage the frequency of the standard oscillator is continuously changed by replacing the quartz crystals and by controlling a variable condenser connected with the crystals. A compensation method is employed for reducing the effects of the temperature fluctuation at higher temperature and of the pressure change of the surrounding gas. The ripples of frequency at 200°C can be reduced to less than 3 Hz. Some examples of the weight gain data for sulphuration and oxidation of vacuum-deposited metal films are presented.
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