Abstract
We propose a method of measuring the electron temperature T_{e} in mesoscopic conductors and demonstrate experimentally its applicability to micron-size graphene devices in the linear-response regime (T_{e} approximately T, the bath temperature). The method can be especially useful in case of overheating, T_{e}>T. It is based on analysis of the correlation function of mesoscopic conductance fluctuations. Although the fluctuation amplitude strongly depends on the details of electron scattering in graphene, we show that T_{e} extracted from the correlation function is insensitive to these details.
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