Abstract
The following paper describes the quantitative analysis of wood samples of black pine (Pinus nigra) using a benchtop Micro X-ray Fluorescence (μXRF) device for elemental analysis and surface scanning. Calibration of the device for quantitative elemental analysis and local density measurements of wood was performed by utilizing characteristic X-ray line intensities and backscattered radiation intensities. The influence of a variable wood density and matrix composition on X-ray spectra were studied with Monte Carlo calculations. The Monte Carlo model was validated with a set of reference materials possessing known compositions and densities. It has been demonstrated that Monte Carlo simulations with the MCNP code, along with, only one reference material are required for the quantitative XRF analysis. The backscattered radiation in the XRF spectra can be used for simple recognition of individual tree rings and their corresponding shapes.
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