Abstract
We introduce a new method for material characterization at the nanoscale using arecently developed atomic force microscope (AFM) probe. The FIRAT (force sensingintegrated readout and active tip) probe is integrated into a commercial AFMsystem to obtain time-resolved interaction forces (TRIFs) between the probe tipand sample at speeds suitable for nondestructive and fast imaging of materialproperties. We present a basic interaction model to extract the material elasticityand surface energy. Numerical simulations are performed and compared to theexperimental results for three different polymers and a silicon sample. We find that ourinteraction model does not completely explain the observed long-range surface forces,but it agrees fairly well with the measurements during the tip–sample contact.
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