Abstract
This paper describes a NaI(Tl) scintillation survey meter which can quantify 125I on a contaminated surface in situ. This survey meter has four inherent windows; 20-45 keV the singles photopeak region, 45-80 keV the sum photopeak region, 20-80 keV the total photopeak region, and 80 keV-. The activity was calculated based on the sum peak method. The calculated activity of a point source agreed with the standardized source activity within an uncertainty of about 10% both up to the distance of 3 cm from the detector surface along the axis of the detector and on the detector surface. The activity of a simulated plate source also agreed with the source activity within the same uncertainty.
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