Abstract
X-ray photoemission spectra of Mg, apart from the main lines, contain large contributions arising from volume-plasmon excitations. We have studied the evolution of the plasmon-loss structures accompanying the Mg 1s core level as a function of film thickness for Mg overlayers evaporated on polycrystalline Pd foils. The procedure involves the fitting of a thickness-dependent spectral function to the plasmon-loss tail of a core line. The full width at half maximum of the plasmon resonance decreases while the number of plasmons increases with the increasing thickness of the overlayer. The quantitative evaluations of the experimental spectra enable us to estimate the thickness of a free-electron-like metallic overlayer. The plasmon-derived film thickness is compared with the results obtained by three other methods of thickness determination. Based on these comparisons we propose the Stranski-Krastanov growth mode for Mg overlayers evaporated on Pd.
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