Abstract
Studies are made on quantitative GDOS depth profile analysis for ZnNi-coatings. Relative and absolute depth resolution on the interface ZnNi-coating/steel substrate were evaluated in a thickness range of 0.5 to 5 μm using two different anode tube diameters. For quantification, an improved approach of the model of constant emission yield was established. The results are demonstrated on ZnNi-electrodeposits with different coating thickness and chemical content.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Published version (
Free)
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
