Abstract
A new quantitative and chemical-state analysis method to measure oxygen on the surface of graphitic carbon materials by total-electron-yield soft X-ray absorption spectroscopy (TEY-XAS) is proposed, and applied to the analysis of graphite oxides (GO). In this method, working curves for quantitative analysis were successfully obtained from the relative absorption- peak-intensity in the OK and CK absorption edges as functions of the O/C atomic ratio in standard organic samples which have various oxygenated functional groups. The atomic ratio O/C on the GO surface was determined as approximately 0.35 from the working curves, and the chemical states of surface oxygen were estimated as mainly –OH and partially >C=O and/or –CH=O from the finger print method of the TEY-XAS.
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