Abstract
X-ray absorption near edge structure (XANES) of Ti K-edge of Ti−Si mixed oxides and titania supported on silica with various Ti contents was studied to investigate the fractions of Ti−O−Si and Ti−O−Ti bonds quantitatively by fitting the preedge of Ti K-edge with the linear combination of two reference XANES spectra. In mixed oxides, the fraction of Ti−O−Ti was increased up to 0.55 when Ti/Si was varied from 0.04 to 0.5. The greatest change of each fraction occurred around 0.15−0.2 of Ti/Si, which was coincident with the formation of anatase titania as observed by XRD. For titania supported on silica with a surface area of 300 m2 g-1, the preedge fitting results combined with XRD and XPS indicated that monolayer coverage was reached around 7−10 wt % Ti loading where the amount of Ti in Ti−O−Si was saturated to 0.56 mmol-Ti/g-material. This work demonstrated the possibility of the quantification of Ti−O−Si and Ti−O−Ti bonds in Ti−Si binary oxides by using the linear combination of reference XANES spectra. K...
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