Abstract
The time-of-flight version of low energy ion scattering LEIS (TOF), avoids uncertainties in quantitative analysis due to neutralization in scattering. However, some other factors to consider are: a) accuracy of the scattering cross-sections employed, b) enhancement of scattering yields from sub-surface layers by focusing effects, c) dependence of detector efficiency on scattered energy, and d) background subtraction in integration of single-scattering peaks. We have investigated these problems using 2.4–10 keV Ne + beams scattered from a Cu 3Au (100) ordered surface in conjunction with computer simulation of the energy spectra and have found c) to be the most important potential source of error. Correction factors are derived from measurements of scattering yield vs E 0.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Nuclear Instruments and Methods In Physics Research
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
