Abstract

From a systematic study of the threshold current density as a function of temperature and hydrostatic pressure, in conjunction with theoretical analysis of the gain and threshold carrier density, we have determined the wavelength dependence of the Auger recombination coefficients in InGaAsSb/GaSb quantum well lasers emitting in the 1.7–3.2 µm wavelength range. From hydrostatic pressure measurements, the non-radiative component of threshold currents for individual lasers was determined continuously as a function of wavelength. The results are analysed to determine the Auger coefficients quantitatively. This procedure involves calculating the threshold carrier density based on device properties, optical losses, and estimated Auger contribution to the total threshold current density. We observe a minimum in the Auger rate around 2.1 µm. A strong increase with decreasing mid-infrared wavelength (<2 µm) indicates the prominent role of intervalence Auger transitions to the split-off hole band (CHSH process). Above 2 µm, the increase with wavelength is approximately exponential due to CHCC or CHLH Auger recombination, limiting long wavelength operation. The observed dependence is consistent with that derived by analysing literature values of lasing thresholds for type-I InGaAsSb quantum well diodes. Over the wavelength range considered, the Auger coefficient varies from a minimum of 1 × 10−16cm 4 s−1 at 2.1 µm to ∼8 × 10−16cm4 s−1 at 3.2 µm.

Highlights

  • Semiconductor lasers emitting in the midwave infrared have become key components in numerous applications, including compact mid-IR absorption spectroscopy, free-space optical communications and military counter-measures

  • This points to an underlying physical process which fundamentally limits the performance of type-I mid-IR lasers, especially at wavelengths extending to 3 μm and beyond

  • Quantitative Auger coefficients were derived using calculated threshold carrier densities that account for the number of active quantum wells (QWs), optical loss, and waveguide properties of each laser

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Summary

Introduction

Semiconductor lasers emitting in the midwave infrared (mid-IR) have become key components in numerous applications, including compact mid-IR absorption spectroscopy, free-space optical communications and military counter-measures. 1a plots Jth for a selection of the best high-performance mid-IR type-I InGaAsSb QW lasers . 1,2,11,12,3–10 For lasing wavelengths between 2.05 and 2.65 μm, the threshold current densities at room temperature are below 100 A/cm, and they remain below 200 A/cm in devices operating up to 3 μm These are among the lowest thresholds reported for any edge emitting quantum well semiconductor lasers, regardless of wavelength 13. Despite substantial differences in the device design parameters (number of quantum wells, band offsets, strain etc.), which are likely close to optimal in each case due to the high-performance characteristics, T0 systematically decreases with increasing wavelength. Detailed consideration shows that a given device’s characteristic temperature depends on various parameters and its heterostructure design, and T0 itself can depend strongly on temperature due to the complex interplay of different recombination processes 18

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