Quantification procedures in micro X-ray fluorescence analysis

Abstract

For the quantification in micro X-ray fluorescence analysis standardfree quantification procedures have become especially important. An introduction to the basic concepts of these quantification procedures is given, followed by a short survey of the procedures which are available now and what kind of experimental situations and analytical problems are addressed. The last point is extended by the description of an own development for the fundamental parameter method, which renders the inclusion of nonparallel beam geometries possible. Finally, open problems for the quantification procedures are discussed.