Quality Monitoring and Prognostic of Electronics Using Multidimensional Time Series Method

Abstract

This paper presents a quality monitoring and prognostic method to evaluating quality of electronics through monitoring degradation path. Electronics multiple performance parameter degradation data are treated as multidimensional time series and described using multidimensional time series model to take into account implements of stochastic nature of environmental variables and to predict long-term trend of performance degradation. A degradation test is processed for certain electronics and three kinds of performance parameters degradation data are monitored for prognostics. A comparison between the predicted degradation path using multidimensional time series analysis, the predicted degradation path using one-dimensional time series analysis and the real degradation path of the electronics is processed and the results show that the degradation path prediction using the suggested method is more effective than one-dimensional time series analysis.