Abstract
This paper presents a performance analysis of silicon photovoltaic cells performed on a diagnostic device used in a laboratory which allows the measurement of photovoltaic cell performance parameters and the detection of failures such as cracks, micro-cracks, corrosion, cold solder points, and others caused by the process of aging, manufacturing, and post-manufacturing. Quantitative diagnostic tests are performed under a continuous light source and heating and cooling sources of photovoltaic cells, controlled, allowing the measurement of the I-V characteristic curve of a photovoltaic cell under different types of irradiance and temperature. The device also allows capturing thermal and high-resolution images to identify possible defects found in photovoltaic cells. Experimental tests were performed considering the I-V curve parameters, thermography, and visual inspection of an enlarged image.
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