Qualitative analyses of thin film-based materials validating new structures of atoms

Abstract

An X-ray instrument is a paramount technique for analyzing the structures of electronic and crystalline materials. In materials chemistry and physics, discussing the results of X-ray techniques is a routine job. In the thin film, powder, bulk, or another form of material, suitable electronic rings of the atoms forming the top-layered surface experience X-rays. Reflection and inverse reflection of X-rays define the peaks upon interaction with left and right-sided segments of electronic tips constructing suitable rings of atoms. In X-ray analysis, X-rays interact with the north side of the electrons. The X-rays interact with the electrons from the left side when the incidence of X-rays is from the left side. If the 2θ is also less than 90°, the X-ray incidence is from the downward side, so the X-rays get reflected tangentially to the inward sides recording intensity at the position of the detector. When the incidence of X-rays is from the right side, the X-rays interact with the electrons from the right side. As the 2θ is greater than 90°, the X-ray incidence is from the upward side. The X-rays get reflected tangentially mainly to the outer sides, thus not recording intensity at the position of the detector. The present work discusses the X-ray patterns of titanium nitride coating, carbon film rich in nanocrystalline diamond phase, and tantalum carbide film in preliminary detail. In developing electronic or crystalline materials, a primitive cell does not form a basis of a crystal structure. A lattice constant appears to be irrelevant now. The 2θ length between the peaks depends on the distance between the associated electronic rings of atoms. The results of this study agree with the atomic and electronic structure presented under the new insight.