Abstract
Textured lanthanum modified lead titanate ferroelectric thin films have been prepared on Pt/Si substrates by a diol-based sol-gel procedure. Precursor solutions including a growing excess of PbO, and crystallization with a heatin rate higher than 500°C min -1 , are used. Pb/Ti ratio in films is measured by EDXS, and is found to increase systematically with the excess of PbO included in solutions. Such increase in Pb/Ti is likely related to the disappearance of a Pb deficient second phase, reaching the nominal value of the perovskite in those films prepared from solutions including a 20% excess of PbO Films dielectric constant, e, remanent polarization, P R , and pyroelectric coefficient, γ, measured in poled samples, increase as the Pb/Ti ratio, reaching values of -730, ∼25 μC cm -2 and ∼ 1.4x10 -2 μC cm -2 K - in those with the nominal ratio of the perovskite. Infrared sensor figures of merit for voltage responsivity, F v γ/ e, and specific detectivity, F m γ/ (e) 1/2 , are calculated. The possibility of using films containing small amounts of second phase, with a smaller pyroelectric coefficient, but with a smaller dielectric constant, is discussed.
Published Version
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