Abstract
Seven synthetic graphite powders of different grade of purity were analyzed by means of INAA, WDXRF, EDXRF, DC-OES directly and using ICP-MS, ICP-OES, ETAAS and FAAS in combination with various sample preparation techniques. On the basis of a statistical evaluation of the results obtained, for the trace elements Al, Ca, Cr, Cu, Fe, Mn and Ni, reference values were established and, for the elements As, Co, Mg, Mo, Pb, Sb, Si, Sr, Ti, V, Zn and Zr, informative values are given. The analyzed reference materials are commercially available.
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