Abstract
AbstractIridium film is a potential candidate as a buffer layer for yttrium barium copper oxide (YBCO) coated conductors. Pulsed laser deposition (PLD) of biaxially textured CeO2/yttrium stabilized zirconium oxide (YSZ) layers on electrodeposited Ir/Ni-W is reported. Biaxial texturing is obtained by deposition of a YSZ seed layer at 800°C in 10-6 Torr vacuum. X-ray diffraction (XRD) studies of Θ-2Θ and pole figure confirmed in-plane out-of-plane biaxial texturing with Δφ = 6.5° and Δω = 8°. Atomic force microscopy (AFM) revealed a surface with roughness of about 3 nm.
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