Abstract
Pulsed laser deposition (PLD) of biaxially textured Y 2O 3 stabilized ZrO 2 (YSZ) layers on electrodeposited Ir/Ni–W tape is reported. Biaxial texturing is obtained by deposition of an YSZ seed layer at 800 °C in 10 −6 Torr vacuum. X-ray diffraction (XRD) studies of θ–2 θ and pole figures confirmed in-plane, out-of-plane biaxial texturing with Δ ϕ = 8° and Δ ω = 7.9°. Atomic force microscopy (AFM) revealed a surface with roughness of about 3 nm.
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