Abstract

Bi1.1SrxFe0.9Zn0.1O3 (x=0.05,0.1) (BSFZO), Bi1.1SrxFe0.9O3 (x=0.05,0.1) (BSFO), and Bi1.1Fe0.9Zn0.1O3 (BFZO) thin films have been prepared on Pt/TiO2/SiO2/Si substrates by pulsed laser deposition, and their ferroelectric and ferromagnetic properties have been characterized. X-ray diffraction (XRD) patterns of BSFO and BFZO thin films show a peroveskite single phase and BSFO thin films show shifting and splitting of peaks with increasing fraction of Sr. The BFZO thin film shows a lower leakage current than the BFO thin film and their P–E and M–H hysteresis loops are obtained. The XRD peaks of BSFZO thin films also shift to an angle lower than that of BFO thin films. The P–E hysteresis loop is obtained at 80 K and the reamanent polarizations of the Bi1.1SrxFe0.9Zn0.1O3 thin film are 79 and 58 µC/cm2 for x=0.05 and 0.1, respectively. The M–H hysteresis loop is also obtained at 80 K and the reamanent magnetization and coercive field are 1.1 and 6 emu/cm3, and 222 and 792 Oe at a maximum magnetic field of 10 kOe for x=0.05 and 0.1, respectively.

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