PULSE ELECTRODEPOSITED NANO-SIZED Ni–AlN THIN FILMS: PREPARATION AND CORROSION RESISTANCE PREDICTION USING BACKWARD PROPAGATION NETWORK MODEL

Abstract

Nano-sized Ni–AlN thin films were prepared by pulse electrodeposition (PE) on A3 steel substrates. The microstructures, surface root-mean-square roughnesses, microhardness values, and corrosion performances of obtained nano-sized Ni–AlN thin films were investigated. Corrosion weight losses of Ni–AlN thin films were predicted by Backward propagation (BP) networks model. The results indicated that average diameters of Ni and AlN embedded in the films were evaluated to 57.9 and 29.2[Formula: see text]nm, respectively. Also, thin films were observed with uniform and compact surface structures, and Rq value was estimated to only 32.75[Formula: see text]nm.