Abstract
InfraRed Thermography (IRT) is one of the non-destructive testing and evaluation (NDT&E) approach widely used for testing and evaluation of wide verity of materials such as metals, semiconductors and composites. Among the widely used Thermal NDT&E (TNDT&E) approaches for better depth resolution and sensitivity for detection of defects located at different depths inside the test specimen recently proposed correlation based approach gained importance due to its enhanced defect detection capabilities. The present paper introduces a novel one-dimensional analytical solution for the frequency modulated excitation scheme under adiabatic boundary conditions for detection of flat bottom holes as defects in a mild steel sample. The performance of the Pulse Thermography (PT), Lock-in Thermography (LT) and Frequency Modulated Thermal Wave Imaging (FMTWI) methods are highlighted their defect detection capabilities have been compared by adopting the recently introduced correlation based post-processing approach. Finally, the proposed analytical method has been validated with the results obtained from the commercially available finite element based software.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
