Abstract
The relevance of testing of memory devices of modern computing systems is shown. The methods and algorithms for implementing test procedures based on classical March tests are analyzed. Multiple March tests are highlighted to detect complex pattern-sensitive memory faults. To detect them, the necessary condition that test procedures must satisfy to deal complex faults, is substantiated. This condition is in the formation of a pseudo-exhaustive test for a given number of arbitrary memory cells. We study the effectiveness of single and double application of tests like MATS ++, March C– and March A, and also give its analytical estimates for a different number of k ≤ 10 memory cells participating in a malfunction. The applicability of the mathematical model of the combinatorial problem of the coupon collector for describing multiple memory testing is substantiated. The values of the average, minimum, and maximum multiplicity of multiple tests are presented to provide an exhaustive set of binary combinations for a given number of arbitrary memory cells. The validity of analytical estimates is experimentally shown and the high efficiency of the formation of a pseudo-exhaustive coverage by tests of the March A type is confirmed.
Highlights
The methods and algorithms for implementing test procedures based on classical March tests are analyzed
The necessary condition that test procedures must satisfy to deal complex faults, is substantiated. This condition is in the formation of a pseudo-exhaustive test for a given number of arbitrary memory cells
We study the effectiveness of single and Информатика. 2020
Summary
При описании предыдущей и текущей фаз теста, приведенных в табл. 1, показана последняя операция записи в фазе, после которой могут быть только операции чтения. Орбита Oi, i {0, 1, 2, 3}, сформированная в произвольных k ячейках памяти как результат применения одной из фаз маршевого теста типа MATS++ и March C−, состоит из k-разрядных двоичных векторов P0, P1, ..., Pk. Данное определение обобщается для произвольной фазы любого маршевого теста и оценивает сложность орбиты, формируемой фазой маршевого теста. Что тесты типа MATS++ и March C− для того же значения k = 5 соответственно формируют k + 1 = 6 и 2k = 10 двоичных наборов. В случае тестов типа MATS ++ применение маршевого теста позволяет генерировать одну орбиту, включающую k + 1 различных k-разрядных двоичных векторов. Для формирования всевозможных 2k двоичных векторов в k > 1 произвольных ячейках памяти маршевый тест типа MATS ++ должен выполняться многократно при различных начальных условиях, обеспечивающих генерирование неэквивалентных орбит в k ячейках.
Sign-in/Register to view highlights & summary Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
