Abstract

Studying the efficiency of memory system tests, we have to take into consideration the complexity of generating all 2k combinations for k memory cells, which is an essential and in many cases sufficient condition, which allows detecting different complex faults given by a parameter k. This paper introduces a new concept for pseudo exhaustive computer memory testing based on multi-run march tests with random backgrounds. The analytical estimation as the approximation of the pseudo-exhaustive test complexity based on the Coupon Collector's Problem was obtained. The set of experimental validation results have been presented and analyzed.

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