Abstract
The low Z elements in the matrix charnockite composition are the problem, according to proton induced X-ray emission analysis with 3 MeV energy and a Si (Li) detector. The charnockite composition analysis with a proton microprobe is affected by the energy of the ion beam, the X-ray yield of a number of atoms, the ionisation cross-section, the energy-dependent detection efficiency of the semiconductor detectors used, and several other aspects. It's difficult to compute the absolute concentration of component Z < 17 in an unknown charnockite matrix. As a result, modifying the dimensions of the detector, window, or incident proton beam energy can be used to evaluate light elemental sensitivity. Low Z elements in charnockite matrix materials can also be discovered using complementary analytical methods.
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