Proton-induced single-event effects on 28 nm Kintex-7 FPGA

Abstract

Proton experiments were performed on Kintex-7 XC7K70T field programmable gate array by using a self-developed test system at EN tandem accelerator in Peking University. The single-event upset and multiple-bit upsets induced by low-energy proton were presented, and a cross section peak under the low-energy protons was tested. Also, the experiments under high-energy protons were performed on the proton cyclotron accelerator in the China Institute of Atomic Energy, cross sections of some blocks in FPGA were obtained. Data of low-energy and high-energy experiments showed that the LET threshold of some resources were different. Results suggest that the low-energy proton-induced single event effect must be considered.