Abstract
Free electron analog to digital conversion is accomplished by deflecting an electron beam bunch transversally by the voltage to be sampled and then quantizing the deflected angle in an array of electron detectors. Miniaturization of the whole system, especially the deflection plates, leads to an improved performance. A system restricted by the fundamental limit of diffraction could achieve a sampling rate of 1THz with 8bit resolution; the source requirements would be a brightness of 2×1013Acm−2∕sr at 5kV and a source jitter of 1fs. A more practical system using a negative electron affinity photocathode electron source with a brightness of 1×107Acm−2∕sr at 5kV will allow the system to sample 4bits at 750GHz or 6bits at 450GHz.
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