Abstract

This paper investigates the challenges and limitations of existing techniques of handling power bus modeling, power supply noise, and the usage of decoupling capacitor at the chip and package levels. One major aspect of the existing works is that handling of these issues at the package and at the chip levels are addressed in two separate phases by two separate groups. Considering the package-chip co-design reality for very high performance integrated circuits in future, it is more effective to tackle all these issues together in one working phase rather than trying to resolve each at a time. This ensures more efficient design by providing options to trade off noise tolerance, number and location of decoupling capacitors, silicon resource used by decoupling, and design limitations for power bus modeling. This paper attempts to identify the common issues that need to be resolved at both package and chip level. It also points out where the existing technology stands, what are the challenges and limitations of existing methodologies and techniques, and what are the options to improve the efficiency of analysis and handling of power supply noise at both levels

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