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Abstract
We have performed transport measurements on intrinsic Josephson junctions in misaligned thin films of Tl 2Ba 2CaCu 2O 8. This has been done in both zero field and in-plane aligned magnetic fields of up to 5 T. We have compared wet-etched and ion-milled devices and find that the more precise structure produced by ion-milling gives superior results. In the case of ion-milled devices we are able to individually switch on up to 50 junctions. For an n-plane field of 3 T there is complete suppression of the critical current. We have seen displaced branches for in-plane fields above 1.5 T. This branching is due to Josephson flux flow. For in-plane fields greater than 2 T the relationship between the maximum flux-flow voltage and the applied field is linear.
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