Abstract
We present experimental results on YBCO thin film bi-crystal junctions in which additional metallic shunt resistors are added by in-situ thin film evaporation of gold or silver. The current-voltage characteristics have been measured, as well as the broad band noise in the system between 1 Hz and 100 kHz, using a HTS dc SQUID as a low-noise preamplifier. The influence of the shunt resistors on the excess noise contributions is discussed and the measured shunt resistance results are compared with a resistive network model.
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