Abstract
Results are presented of studies on the application of InSb thin films for measuring rapidly varying pressures up to 600 atm in liquid non-conducting media. A comparison is made between this transducer and the quartz pressure transducer used as devices for measuring rapidly varying pressures. The dynamic error in a pressure-measuring system which included an indium antimonide thin film resistance transducer has been determined as less than 1.5%.
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