Abstract
Hg based cuprate thin films of thickness 200 nm were prepared on various substrates (MgO, LaAlO3 and CeO2 buffered sapphire) by a two step procedure. Both, air stable Ba−Ca−Cu−(O,F) precursor films and Re doped (Hg,Re)−Ba−Ca−Cu−O pellets were used. The X-ray diffraction analyses and dc resistivity measurements indicate that the Hg cuprate films contain the majority HgBa2CaCu2Ox (Hg-1212) and minority HgBa2Ca2Cu3Oy (Hg-1223) phases. These films were investigated in a small magnetic field (<50 mT) to estimate the influence of weak links, between grains or between both phases, on the value of dc transport critical current.
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