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Abstract
ZnTe thin films, prepared by two-sourced evaporation of zinc and tellurium, were immersed in Cu(NO 3) 2–H 2O solution for different time periods. The sheet resistance drastically decreased due to Cu diffusion in the films. Structure of the films is studied by X-ray diffraction (XRD), while the optical properties, such as film thickness, refractive index, absorption coefficient and optical band gap have been calculated from the normal transmission spectra in the range 400–2000 nm.
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