Abstract
ZnTe thin films were deposited by closed space sublimation (CSS) technique on amorphous glass substrate. The deposited films were immersed in AgNO3 solution for different time periods, then heated in vacuum. The resistivity of the film, immersed for 30min, was reduced by less than six orders of magnitudes. The films structures were characterized by X-ray diffraction (XRD). Atomic force microscope (AFM) was used to detect the surface morphology of the films. The films thickness, the optical properties, such as refractive index, absorption coefficient and the optical band gap were determined from transmittance spectra in the wavelength range of 400–2500nm. The dark electrical conductivities of the films were studied as function of temperature to determine the conductivity activation energy.
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