Abstract
The characteristics of a dielectric probe for scanning near-field millimeter wave microscopy are presented in this paper. The dielectric probe was fabricated from Teflon and shaped like a cone. The beam profile of the millimeter-wave radiated from the tip of the Teflon probe was measured by three-dimensional scanning using a different Teflon probe. The 93.5 GHz millimeter wave was focused on the tip of the probe at the wavelength level, and the millimeter-wave power was found to decrease exponentially with distance from the tip, the same as a near-field wave.
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