Programmable aging sensor for automotive safety-critical applications

Abstract

Electronic systems for safety-critical automotive applications must operate for many years in harsh environments. Reliability issues are worsening with device scaling down, while performance and quality requirements are increasing. One of the key reliability issues is long-term performance degradation due to aging. For safe operation, aging monitoring should be performed on chip, namely using built-in aging sensors (activated from time to time). The purpose of this paper is to present a novel programmable nanometer aging sensor. The proposed aging sensor allows several levels of circuit failure prediction and exhibits low sensitivity to PVT (Process, power supply Voltage and Temperature) variations. Simulation results with a 65 nm sensor design are presented, that ascertain the usefulness of the proposed solution.