Abstract
AbstractThis paper reports on the application of the first near‐infrared spectroscopic Mueller Matrix Ellipsometer (MME) based on Ferro‐electric Liquid Crystal retarders (FLC) and fixed waveplates. Operation of the instrument is demonstrated by transmission Mueller matrix measurements, and product decomposition of an imperfect dichroic polarizer and a depolarizing rough glass surface. The decomposition of the measured matrices is qualtitatively discussed in terms of retardance, diattenuation, depolarization, and azimuthal orientation. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)
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