Probabilistic models for estimation of random and pseudo-random test length

Abstract

A new probabilistic testability measure is presented to ease test length analyses of random testing and pseudorandom testing. The testability measure given in this paper is oriented to signal conflict of reconvergent fanouts. Test length analyses in this paper are based on a hard fault set, calculations of which are practicable and simple. Experimental results have been obtained to show the accuracy of this test length analyser in comparison with that of Savir[6], Chin and McCluskey[8], and Wunderlich[4] by using a pseudorandom test generator combined with exhaustive fault simulation.