Priori information analysis of optocoupler accelerated degradation experiment based on failure mechanism verification test

Abstract

The optocoupler is a weak link in the inertial navigation platform of a kind of guided munitions. It is necessary to use accelerated storage test to verify the storage life of long storage products. Especially for small sample products, it is very important to obtain prior information for the design and implementation of accelerated degradation test. In this paper, the optocoupler failure mechanism verification test is designed and the experimental results are analyzed and the prior information is obtained. The results show that optocouplers have two failure modes, one is sudden failure and the other is degradation failure; the maximum temperature stress of optocoupler can't exceed 140 °C; the increase of leakage current of optocoupler is caused by movable ions contaminating the LED chip. The surface leakage current is proportional to the adsorption amount. The increase of leakage current makes p-n junction tunneling effect occur which LEDs the failure of the optocoupler. The lifetime distribution model of the optocoupler is determined by the failure physics. The lifetime of the optocoupler is subject to the lognormal distribution. The degeneracy orbit of the optocoupler leakage current is described by a power law model. The estimated values of the orbital parameters are initially calculated and the parameters of its life distribution function are deduced. The above information lays a good foundation for the optimization design and data processing of the accelerated degradation experiment.