Principles and Basic Modes of Atomic Force Microscopy

Abstract

Atomic force microscopy (AFM) has become an emerging powerful tool for imaging the surface morphology and charge conversion behaviors in energy research. This chapter would provide a series of primary AFM knowledge, structured by eight sections. First, it introduces the fundamental principles, which consider probe deflection behaviors and optical detection mechanisms in detail. The main-streaming AFM imaging modes, i.e. contact mode, tapping mode, and PeakForce tapping mode, have been demonstrated systematically. The best control of the tip-sample force plays a pivotal role in obtaining the ideal topography, especially for the soft, easy-deformed and viscous samples. Hence, we further highlight technical details of force control and quantitative nanoscale mechanical (QNM) measurement, as well as specify how to achieve high-resolution AFM imaging. Then, we give more demonstrations and examples about AFM application in air, liquid, and high-vacuum environments. Finally, local electrical conductivity measurement by conductive AFM mode is briefly presented, including the potential applications of electric current mapping in gas and liquid environments.