Abstract
An estimation of a measurement accuracy at each measured point is crucial regarding the applicability of results of the measurements. The aim of this work is to determine the correlation between individual metrics and the measurement accuracy by using corrected metrics of the correlation plane. This work is based on defining a corrected metric using known metrics corrected by the displacement measured in the last iteration, the number of the particles and the velocity gradient inside the interrogation area. The resulting tests are performed using conventional synthetic tests. The discovered dependencies between individual corrected metrics are subsequently approximated in order to determine the measurement accuracy. And, finally, the most suitable variant for the determination of the accuracy of the measurement by the particle image velocimetry method is specified.
Highlights
We focus on a description of the interconnection between the ratio of the primary and secondary peak in the correlation plane, known as Primary peak ratio (PPR), and the error of evaluation of the measured displacement by the PIV method
The aim of this work is the correction of the PPR metric by the main parameters that define the quality of the measured data in order to find a clear correlation between the metric and the measurement accuracy of the PIV method
The metric PPR is not considering the effect of the number of the particles inside the interrogation area, the diameter of the particles and the displacement measured in the last iteration on the total error of the measurement
Summary
We focus on a description of the interconnection between the ratio of the primary and secondary peak in the correlation plane, known as Primary peak ratio (PPR), and the error of evaluation of the measured displacement by the PIV method. The aim of this work is the correction of the PPR metric by the main parameters that define the quality of the measured data in order to find a clear correlation between the metric and the measurement accuracy of the PIV method. This metric represents the number of particles NI inside the interrogation area and it is a very good measure of the quality of the correlation plane. According to [8], the total error of the measurement dependency on the PPR metric can be defined as follows: σS2CC =
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