Abstract
A pressure device has been developed and adapted to resonant x-ray magnetic scattering (RXMS) technique. The system is optimized for diffraction studies and allows a wide angular aperture in the scattering plane. Pressure changes are made in situ with pressure determination by the ruby fluorescence method. Since the whole device is compatible with a standard Orange cryostat, an extended (p,T) phase space, with T=1.4–300K and p=0–30kbar, can now be probed by RXMS. As an illustration, first results on Ce(CoxFe1−x)2 single crystal are presented. Such a pressure device can be equally used for other than RXMS techniques as shown with the study at low temperature of SmS under pressure using x-ray fluorescence measurements.
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