Abstract

Our letter focuses on the preparation of polyaniline emeraldine base films doped with selenium. PANI EB and Se were dissolved in dimethylsulfoxide. Thin films of selenium-doped PANI EB were obtained by spin-coating of Si and ZnSe substrates with a PANI EB+Se solution in DMSO. We studied the distribution of the selenium in the PANI EB films using time-of-flight secondary ion mass spectrometry (TOF-SIMS). The IR spectra of these thin films were obtained with an FT-IR spectrometer.

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