Abstract

New composite materials were prepared using cesium hydrogen sulfate (CsHSO 4) or cesium dihydrogen phosphate (CsH 2PO 4) and phosphosilicate gel (P 2O 5–SiO 2 gel). In X-ray diffraction patterns of these composites, diffraction peaks due to Cs 2H 5(SO 4) 2(PO 4) and CsH 5(PO 4) 2 were observed for CsHSO 4–(P 2O 5–SiO 2 gel) composites and CsH 2PO 4–(P 2O 5–SiO 2 gel) composites, respectively. These composites showed high conductivities in the order of 10 − 3 S cm − 1 at 150 °C due to melting of Cs 2H 5(SO 4) 2(PO 4) or CsH 5(PO 4) 2 in the composites. In the cooling process, the CsHSO 4–(P 2O 5–SiO 2 gel) composites kept relatively high conductivity to 110 °C where solidification of Cs 2H 5(SO 4) 2(PO 4) occurs, whereas CsH 2PO 4–(P 2O 5–SiO 2 gel) composites showed relatively high conductivity continuously to ambient temperature.

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