Abstract

AbstractA method for the preparation of planview transmission electron microscope (TEM) specimens of expitaxial Yba2Cu3O7−x (YBCO) thin films deposited on BaF2 by a dc modified planar magnetron sputtering technique is reported. The films are granular with their grains size ranging from a few hundred to a few thousand nanometers. The epitactic nature of the film growth is shown by analyses of moiré fringe patterns and by selected area diffraction methods. It is demonstrated that the YBCO thin film obtained is highly c-axis oriented, with misorientation corresponding to rotations of 9.2° and 90° about the c-axis. Additionally, the film's a or b axes form a 45° angle with that of the substrate.

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.