Abstract
The magnet-optical films of TbFeCo and Ag/TbFeCo were prepared on the Si substrates by magnetron sputtering. The spectra of Kerr ellipticity and Kerr rotation were measured at room temperature and the remarkable enhancement of Kerr effect was observed at short wavelength. The enhancement of Kerr effect is not caused by the interference between layers, but the resonance-like peak due to the presence of the plasma absorbing edge of Ag. The thickness of Ag layer has important influence on the enhancement of Kerr effect and the enhancement of Kerr effect will be disappeared as Ag layer is over than 50 nm.
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