Abstract
Abstract Thin films of LaNi5 have been prepared by means of a flash evaporation-deposition technique. Electric resistivity measurements on these films were carried out in an atmosphere of hydrogen. The films formed on quartz substrates were amorphous. Resistivities initially increased and then decreased during the absorption of hydrogen. During the desorption process, the reverse phenomenon was observed. The effect of the thickness of the films on the electric properties, during the hydrogen absorption-desorption process, was also studied. Sample pulverization could be avoidable by using films of less than 10 μm in thickness. The hydrogen contents of the films were determined by the quartz-crystal mass-monitoring (QCMM) method.
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