Abstract
Electrical resistivities of amorphous LaCo 5 films were measured under an atmosphere of hydrogen. The resistivity increased during the absorption of hydrogen. Hydrogen in the film seems to exist as hydrogen anions. The effect of film thickness on the electrical properties during the hydrogen absorption-desorption process was also studied. The hydrogen content in LaCo 5 films of various thickness was determined using a quartz crystal mass monitoring (QCMM) method. The hydrogen concentration increased with increasing film thickness. In pressurecomposition isotherms, the H LaCo 5 ratio was found to increase monotonously with an increase in pressure, while a pressure plateau was absent.
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